![]() ![]() The interaction between the electron beam and the sample creates secondary electrons, backscattered electrons, and X-rays. Once the focused stream reaches the sample, it scans its surface in a rectangular raster. The electron beam is focused using electromagnetic lenses. To obtain a high-resolution image, an electron source (also known as an electron gun) emits a stream of high-energy electrons towards a sample. The sample’s size is limited only by the size of the electron microscope chamber. SEM is able to capture 3-D black-and-white images of thin or thick samples. SEM images give insight into a sample’s topography and elemental composition. SEM has the potential to magnify an image up to 2 million times. The microscope records information about the interaction between the electrons and the sample, creating a magnified image. An SEM is a kind of electron microscope that uses a fine beam of focused electrons to scan a sample’s surface. SEM can stand for either Scanning Electron Microscopy or Scanning Electron Microscope. This article will overview SEM and TEM, including what they are, how they work, and how they compare to one another. TEM and SEM differ in how they work and what types of images they are able to capture. Scanning Electron Microscopy (SEM) and Transmission Electron Microscopy (TEM) are the two most common types of electron microscopy. The image created reveals details of a sample’s surface or internal composition, depending on the type of electron microscope that is used. ![]() Interactions between the electron beam and the sample create an image, similar to how optical microscopes use light to capture images. Electron microscopes can capture much higher resolution images than light microscopes, contributing information that is otherwise unattainable.Įvery electron microscope works by accelerating a focused stream of electrons in a vacuum towards a sample. Electron microscopy is a valuable tool used to obtain high-resolution images in a variety of applications, including biomedical research, forensics, and technology. ![]()
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